21 citations · 27 across the 15 of their papers we have counts for
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stat.AP2022
Robust estimation based on one-shot device test data under log-normal lifetimes
N. Balakrishnan, E. Castilla
In this paper we present robust estimators for one-shot device test data under lognormal lifetimes. Based on these estimators, confidence intervals and Wald-type tests are also dev…
stat.AP2020
Divergence-based robust inference under proportional hazards model for one-shot device life-test
N. Balakrishnan, E. Castilla, N. Martin +1
In this paper, we develop robust estimators and tests for one-shot device testing under proportional hazards assumption based on divergence measures. Through a detailed Monte Carlo…
stat.AP2020
Power divergence approach for one-shot device testing under competing risks
N. Balakrishnan, E. Castilla, N. Martin +1
Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experienc…