2 papers
cond-mat.mtrl-sci2025
Characterization of WSe films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses
Tianbi Zhang, Jakub Holzer, Tomáš VystavÄl +4
The study of thin films and 2D materials, including transition metal dichalcogenides such as WSe offers opportunities to leverage their properties in advanced sensors, quantum…
cond-mat.mtrl-sci2025
Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
Tianbi Zhang, Lukas Berners, Jakub Holzer +1
Recent advances in scanning electron microscope (SEM) based Kikuchi diffraction have demonstrated the important potential for reflection and transmission methods, like transmission…