66 citations · 293 across the 13 of their papers we have counts for
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cs.CV2019★ 15 cited
Sampling Limits for Electron Tomography with Sparsity-exploiting Reconstructions
Yi Jiang, Elliot Padgett, Robert Hovden +1
Electron tomography (ET) has become a standard technique for 3D characterization of materials at the nano-scale. Traditional reconstruction algorithms such as weighted back project…
cs.CV2019★ 31 cited
Removing Stripes, Scratches, and Curtaining with Non-Recoverable Compressed Sensing
Jonathan Schwartz, Yi Jiang, Yongjie Wang +6
Highly-directional image artifacts such as ion mill curtaining, mechanical scratches, or image striping from beam instability degrade the interpretability of micrographs. These unw…