activity
20162022
most citedRapid characterization of wafer-scale 2D material: Epitaxial graphene and graphene nanoribbons on SiC

3 citations · 3 across the 6 of their papers we have counts for

collaborators

7 papers

cond-mat.mes-hall2022

Large-scale five- and seven-junction epitaxial graphene devices

Dinesh Patel, Martina Marzano, Chieh-I Liu +8

The utilization of multiple current terminals on millimeter-scale graphene p-n junction devices has enabled the measurement of many atypical, fractional multiples of the quantized…

cond-mat.mes-hall2022

Algorithms for determining resistances in quantum Hall annuli with p-n junctions

Chieh-I Liu, Dominick S. Scaletta, Dinesh K. Patel +4

Just a few of the promising applications of graphene Corbino pnJ devices include two-dimensional Dirac fermion microscopes, custom programmable quantized resistors, and mesoscopic…

cond-mat.mes-hall2022

Fabrication of quantum Hall p-n junction checkerboards

Dinesh K. Patel, Martina Marzano, Chieh-I Liu +4

Measurements of fractional multiples of the ν=2 plateau quantized Hall resistance (R_H {\approx} 12906 Ω) were enabled by the utilization of multiple current terminals on millimetr…

cond-mat.mes-hall2022

Quantum Hall Junction Dartboards Using Graphene Annuli

Chieh-I Liu, Dinesh K. Patel, Martina Marzano +3

The use of multiple current terminals on millimeter-scale graphene junction devices fabricated with Corbino geometries, or quantum Hall resistance dartboards, have enabled th…

physics.app-ph2018

Confocal laser scanning microscopy: A tool for rapid optical characterization of 2D materials

Vishal Panchal, Yanfei Yang, Guangjun Cheng +9

Confocal laser scanning microscopy (CLSM) is a non-destructive, highly-efficient optical characterization method for large-area analysis of graphene on different substrates, which…

physics.app-ph20173 cited

Rapid characterization of wafer-scale 2D material: Epitaxial graphene and graphene nanoribbons on SiC

Vishal Panchal, Yanfei Yang, Guangjun Cheng +8

We demonstrate that the confocal laser scanning microscopy (CLSM) provides a non-destructive, highly-efficient characterization method for large-area epitaxial graphene and graphen…