activity
20162026
most citedHarmonics-assisted optical phase amplifier

22 citations · 64 across the 21 of their papers we have counts for

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17 papers · 1 filter

quant-ph2025

Generation of Near-ideal Indistinguishable Two-Photon State by Incoherent Light

Yue-Wei Song, Ming-Yuan Gao, Zhi-Cheng Guo +5

High-quality quantum states lie at the heart of advanced quantum information processing. The degree of photon indistinguishability is critical for applications from photonic quantu…

quant-ph2024

On Chip Quantum States Generation by Incoherent Light

Yue-Wei Song, Heng Zhao, Li Chen +9

On-chip quantum sources based on nonlinear processes are pivotal components in integrated photonics, driving significant advancements in quantum information technologies over recen…

quant-ph20241 cited

Quantum key distribution based on mid-infrared and telecom band two-color entanglement source

Wu-Zhen Li, Chun Zhou, Yang Wang +11

Due to the high noise caused by solar background radiation, the existing satellite-based free-space quantum key distribution (QKD) experiments are mainly carried out at night, hind…

quant-ph2024

Narrowband telecom band polarization-entangled photon source by superposed monolithic cavities

Ming-Yuan Gao, Yin-Hai Li, Yan Li +4

A high-quality narrowband polarization-entangled source in the telecom band is preferred to avoid frequency dispersion for long-distance transmission in optical fibers and to effic…

quant-ph2024

Polarization entanglement by two simultaneous backward phase-matching processes in a single crystal

Ming-Yuan Gao, Yin-Hai Li, Zhao-Qi-Zhi Han +4

Entanglement enables many promising applications in quantum technology. Devising new generation methods and harnessing entanglement are prerequisites for practical applications. He…

quant-ph20241 cited

Quantum entanglement enabled ellipsometer for phase retardance measurement

Meng-Yu Xie, Su-Jian Niu, Yin-Hai Li +6

An ellipsometer is a vital precision tool used for measuring optical parameters with wide applications in many fields, including accurate measurements in film thickness, optical co…