Identifying Contact Barrier Types in Few-Layer MoS2 Devices Using Correlative IV, LBIC, and Bias-Dependent KPFM

Ariane Ufer, Zeinab Eftekhari, Benjamin Mayer +4

Electrical contacts between metals and two-dimensional (2D) semiconductors such as molybdenum disulfide (MoS2) critically govern device performance, yet their microscopic nature re…