High-Percentage Success Method for Preparing and Pre-Evaluating Tungsten Tips for Atomic-Resolution Scanning Tunneling Microscopy

J. K. Schoelz, P. Xu, S. D. Barber +5

A custom double-lamella method is presented for electrochemically etching tungsten wire for use as tips in scanning tunneling microscopy (STM). For comparison, tips were also manuf…