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eess.IV2025
A Fourier-Based Global Denoising Model for Smart Artifacts Removing of Microscopy Images
Huanhuan Zhao, Connor Vernachio, Laxmi Bhurtel +9
Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and n…
eess.IV2025
Physics-augmented Deep Learning with Adversarial Domain Adaptation: Applications to STM Image Denoising
Jianxin Xie, Wonhee Ko, Rui-Xing Zhang +1
Image denoising is a critical task in various scientific fields such as medical imaging and material characterization, where the accurate recovery of underlying structures from noi…