2 papers
cond-mat.mtrl-sci2025
Extraordinary cation-replace-cation antisite defect predominate in Bi2SeO5
Chen-Min Dai, Feifan Bian, Yafeng Zhang +4
As a newly identified single-crystalline van der Waals dielectric with a high dielectric constant, Bi2SeO5 plays a pivotal role in advancing 2D electronic devices. In this work, we…
cond-mat.mtrl-sci2024
Si/SiO MOSFET Reliability Physics: From Four-State Model to All-State Model
Xinjing Guo, Menglin Huang, Shiyou Chen
As implemented in the commercialized device modeling software, the four-state nonradiative multi-phonon model has attracted intensive attention in the past decade for describing th…