32 citations · 32 across the 3 of their papers we have counts for
3 papers
Investigation of thickness dependent composition of boron carbide thin films by resonant soft x-ray reflectivity
P. N. Rao, R. K. Gupta, K. Saravanan +4
Boron carbide thin films of different thicknesses deposited by ion beam sputtering were studied. The deposited films were characterized by grazing incidence hard x-ray reflectivity…
Study of impurity distribution in mechanically polished, chemically treated and high vacuum degassed pure Niobium samples using TOFSIMS technique
A. Bose, S. C. Joshi Raja Ramanna Centre for Advanced Technology
The performance of Superconducting radio frequency cavities (SRF) is strongly influenced by various impurities within the penetration depth (~50nm) of Nb, which in turn depends on…
Studies on temperature dependent semiconductor to metal transitions in ZnO thin films sparsely doped with Al
Amit K. Das, P. Misra, R. S. Ajimsha +4
For a detailed study on the semiconductor to metal transition (SMT) in ZnO thin films doped with Al in the concentration range from 0.02 to 2%, we grew these films on (0001) sapphi…