18 citations · 26 across the 7 of their papers we have counts for
3 papers · 1 filter
Label-Free Nanoscopy with Contact Microlenses: Super-Resolution Mechanisms and Limitations
Vasily N. Astratov, Farzaneh Abolmaali, Aaron Brettin +5
Despite all the success with developing super-resolution imaging techniques, the Abbe limit poses a severe fundamental restriction on the resolution of far-field imaging systems ba…
iQ Cavity for Material Permittivity Characterization
Kenneth W. Allen, Mark M. Scott
We present an X-band waveguide (WR90) and UHF waveguide (WR1500) measurement method that permits the extraction of the complex permittivity for low dielectric loss tangent material…
An X-Band Waveguide Measurement Technique for the Accurate Characterization of Materials with Low Dielectric Loss Permittivity
Kenneth W. Allen, Mark M. Scott, David R. Reid +4
In this work, we present a new X-band waveguide (WR90) measurement method that permits the broadband characterization of the complex permittivity for low dielectric loss tangent ma…