11 citations · 14 across the 2 of their papers we have counts for
2 papers
physics.ins-det2016★ 3 cited
Characterization of Thin p-on-p Radiation Detectors with Active Edges
T. Peltola, X. Wu, J. Kalliopuska +5
Active edge p-on-p silicon pixel detectors with thickness of 100 m were fabricated on 150 mm Float zone silicon wafers at VTT. By combining measured results and TCAD simulations…
physics.ins-det2015★ 11 cited
Processing and characterization of epitaxial GaAs radiation detectors
X. Wu, T. Peltola, T. Arsenovich +12
GaAs devices have relatively high atomic numbers (Z=31, 33) and thus extend the X-ray absorption edge beyond that of Si (Z=14) devices. In this study, radiation detectors were proc…