activity
19972019
most citedO-vacancy as the origin of negative bias illumination stress instability in amorphous In-Ga-Zn-O thin film transistors

444 citations · 532 across the 8 of their papers we have counts for

collaborators
Showing 2002 · cond-mat.mtrl-sciShow all

Nothing from them under that filter.

Their other years and fields are still on the left.