most citedThe effect of heavy metal in CMOS on neutron induced single event upset simulated with Geant4

2 citations · 2 across the 1 of their papers we have counts for

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1 paper

physics.ins-det2015★ 2 cited

The effect of heavy metal in CMOS on neutron induced single event upset simulated with Geant4

Huan Zhang, Si-guang Wang, Wei Chen +1

Local metal interconnection is widely used in modern complementary metal oxide semiconductor (CMOS) technology. The most frequently used local materials are some heavy metals, such…