L. Kornblum

activity

20152026

most citedThickness Dependence of the Physical Properties of Atomic-Layer Deposited Al2O3

27 citations · 124 across the 15 of their papers we have counts for

collaborators

Showing 2022Show all

2 papers · 1 filter

cond-mat.mtrl-sci2022★ 9 cited

Thickness and temperature dependence of the atomic-scale structure of SrRuO $_{3}$ thin films

Xuanyi Zhang, Aubrey N. Penn, Lena Wysocki +6

Due to the strong lattice-property relationships which exist in complex oxide epitaxial layers, their electronic and magnetic properties can be modulated by structural distortions…

physics.app-ph2022★ 12 cited

Scalable $A l_{2} O_{3} - Ti O_{2}$ Conductive Oxide Interfaces as Defect Reservoirs for Resistive Switching Devices

Yang Li, Wei Wang, Di Zhang +5

Resistive switching devices herald a transformative technology for memory and computation, offering considerable advantages in performance and energy efficiency. Here we employ a s…

Thickness and temperature dependence of the atomic-scale structure of SrRuO3​ thin films

Scalable Al2​O3​−TiO2​ Conductive Oxide Interfaces as Defect Reservoirs for Resistive Switching Devices

Thickness and temperature dependence of the atomic-scale structure of SrRuO $_{3}$ thin films

Scalable $A l_{2} O_{3} - Ti O_{2}$ Conductive Oxide Interfaces as Defect Reservoirs for Resistive Switching Devices