most citedChanging the lattice position of a bistable single magnetic dopant in a semiconductor using a scanning tunneling microscope

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cond-mat.mes-hall2015★ 1 cited

Changing the lattice position of a bistable single magnetic dopant in a semiconductor using a scanning tunneling microscope

J. M. Moore, V. R. Kortan, M. E. Flatté +2

We report a reversible and hysteretic change in the topography measured with a scanning tunneling microscope near a single Fe dopant in a GaAs surface when a small positive bias vo…