999 citations · 1.7k across the 20 of their papers we have counts for
3 papers · 1 filter
Structural analysis of co-sputtered Cu-Nb and Cu-Pd textured thin films
Claudia Cancellieri, Giacomo Lorenzin, Yeliz Unutulmazsoy +2
Structural characterization of nanoscale-two-metal-phase systems, which exhibit partial, complete, or no mixing when co-sputtered with a few percent of a minority element, is extre…
Auger parameter analysis for TiN and AlN thin films via combined in-situ XPS and HAXPES
O. V. Pshyk, J. Patidar, C. Cancellieri +1
Auger parameter analysis provides in-depth information about the electronic and chemical bonding properties of TiN and AlN thin films, which are relevant across a wide range of tec…
Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections
Yang Hu, Aleksandr Druzhinin, Claudia Cancellieri +1
We introduce new models that incorporate layer corrugation and interface roughness into standard approaches for measuring interface stress in nanomultilayers (NMLs). Applied to Cu/…