Spatial-temporal redistribution of point defects in three-layer stressed nanoheterosystems within the framework of self-assembled deformation-diffusion model

R. M. Peleshchak, N. Y. Kulyk, M. V. Doroshenko

The model of spatial-temporal distribution of point defects in a three-layer stressed nanoheterosystem GaAs/In${}_x$Ga${}_{1-x}$As/GaAs considering the self-assembled deformation-dif…