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physics.app-ph2021
Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
Frances I Allen, Thomas C Pekin, Arun Persaud +5
High-throughput grain mapping with sub-nanometer spatial resolution is demonstrated using scanning nanobeam electron diffraction (also known as 4D scanning transmission electron mi…
physics.app-ph2019
Patterned Probes for High Precision 4D-STEM Bragg Measurements
Steven E Zeltmann, Alexander Müller, Karen C Bustillo +4
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a seque…