most citedDirect observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

16 citations · 16 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2014★ 16 cited

Direct observation of the leakage current in epitaxial diamond Schottky barrier devices by conductive-probe atomic force microscopy and Raman imaging

Jose Alvarez, M. Boutchich, J. P. Kleider +2

The origin of the high leakage current measured in several vertical-type diamond Schottky devices is conjointly investigated by conducting probe atomic force microscopy (CP-AFM) an…