2 papers
physics.optics2023
Deep Learning Enables Large Depth-of-Field Images for Sub-Diffraction-Limit Scanning Superlens Microscopy
Hui Sun, Hao Luo, Feifei Wang +9
Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a…
physics.acc-ph2014
SINAP surface preparation processing for 500MHz superconducting cavity
Zhenyu Ma, Haibo Yu, Dongqing Mao +10
This paper illustrates the design, fabrication and experiment results of surface preparation system for 500MHz superconducting cavity at Shanghai Institute of Applied Physic (SINAP…