Phantom LAM and LLI: Resistance and Hysteresis Bias in Voltage-Curve Degradation Mode Analysis

Mohammed Asheruddin N, Matheus Leal De Souza, Thomas Holland +3

Degradation mode analysis (DMA) is widely used to decompose capacity fade into loss of lithium inventory (LLI) and loss of active material (LAM) from low-rate voltage-capacity data…