2 papers
cs.GT2025
LOCO: A Low-Cost SNU-Self-Resilient Latch Using an Output-Split C-Element
Ruijun Ma, Xin Chen, Xiaoqing Wen +4
As the CMOS technology enters nanometer scales, integrated circuits (ICs) become increasingly sensitive to radiation-induced soft errors, which can corrupt the state of storage ele…
cs.LG2025
A Spatio-Temporal Graph Neural Networks Approach for Predicting Silent Data Corruption inducing Circuit-Level Faults
Shaoqi Wei, Senling Wang, Hiroshi Kai +5
Silent Data Errors (SDEs) from time-zero defects and aging degrade safety-critical systems. Functional testing detects SDE-related faults but is expensive to simulate. We present a…