most citedComposition determination of quaternary GaAsPN layers from single XRD measurement of quasi-forbidden (002) reflection

9 citations · 9 across the 1 of their papers we have counts for

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cond-mat.mtrl-sci2014★ 9 cited

Composition determination of quaternary GaAsPN layers from single XRD measurement of quasi-forbidden (002) reflection

J. -M. Tilli, H. Jussila, K. M. Yu +2

GaAsPN layers with a thickness of 30nm were grown on GaP substrates with metalorganic vapor phase epitaxy to study the feasibility of a single X-ray diffraction (XRD) measurement f…