3 papers
cond-mat.mes-hall2025
A scanning probe microscopy approach for identifying defects in aluminum oxide
Leah Tom, Zachary J. Krebs, Joel B. Varley +8
The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Chara…
cond-mat.supr-con2024
Implementing Josephson Junction spectroscopy in a scanning tunneling microscope
Margaret A. Fortman, David C. Harrison, Ramiro H. Rodriguez +6
Josephson junction spectroscopy is a powerful local microwave spectroscopy technique that has promising potential as a diagnostic tool to probe the microscopic origins of noise in…
cond-mat.mes-hall2024
Imaging the diffusive-to-ballistic crossover of magnetotransport in graphene
Zachary J. Krebs, Wyatt A. Behn, Keenan J. Smith +6
Scanning tunneling potentiometry (STP) is used to probe the local, current-induced electrochemical potential of carriers in graphene near circular electrostatic barriers in an out-…