112 citations · 275 across the 4 of their papers we have counts for
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A phantom force induced by the tunneling current, characterized on Si(111)
A. J. Weymouth, T. Wutscher, J. Welker +2
Simultaneous measurements of tunneling currents and atomic forces on surfaces and adsorbates provide new insights into the electronic and structural properties of matter on the ato…
Device for in-situ cleaving of hard crystals
M. Schmid, A. Renner, F. J. Giessibl
Cleaving crystals in a vacuum chamber is a simple method for obtaining atomically flat and clean surfaces for materials that have a preferential cleaving plane. Most in-situ cleave…
Electron scattering in atomic force microscopy experiments
Linda Zotti, Werner A. Hofer, Franz J. Giessibl
It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that…
AFM's path to atomic resolution
Franz J. Giessibl
We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tu…
Simultaneous current-, force- and work function measurement with atomic resolution
M. Herz, Ch. Schiller, F. J. Giessibl +1
The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneou…
Local spectroscopy and atomic imaging of tunneling current, forces and dissipation on graphite
S. Hembacher, F. J. Giessibl, J. Mannhart +1
Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obt…