9 citations · 10 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2014★ 1 cited
XRD fitting analysis of semiconductor heterostructures [Puolijohderakenteiden röntgendiffraktion sovitusanalyysi] (in Finnish)
Juha-Matti Tilli
Analysis of measured X-ray diffraction (XRD) data from heterostructures with fitting analysis is discussed, for which computer program was written. Lattice constant and Poisson's r…
cond-mat.mtrl-sci2014★ 9 cited
Composition determination of quaternary GaAsPN layers from single XRD measurement of quasi-forbidden (002) reflection
J. -M. Tilli, H. Jussila, K. M. Yu +2
GaAsPN layers with a thickness of 30nm were grown on GaP substrates with metalorganic vapor phase epitaxy to study the feasibility of a single X-ray diffraction (XRD) measurement f…