most citedInvestigating Atomic Contrast in Atomic Force Microscopy and Kelvin Probe Force Microscopy on Ionic Systems using Functionalized Tips

68 citations · 68 across the 1 of their papers we have counts for

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1 paper

cond-mat.mes-hall2014★ 68 cited

Investigating Atomic Contrast in Atomic Force Microscopy and Kelvin Probe Force Microscopy on Ionic Systems using Functionalized Tips

Leo Gross, Bruno Schuler, Fabian Mohn +7

Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) have become important tools for nanotechnology; however, their contrast mechanisms on the atomi…