Resolving multiple layer thicknesses and birefringence in thin films with an optical in-line Roll-to-Roll characterization setup

Søren A. R. Kynde, Astrid T. Rømer, Abdelouadoud Mammeri +4

The paper presents an in-line optical imaging system for roll‑to‑roll production that can quickly measure the thickness of multiple thin film layers (0.3–110 µm) and assess birefri…