5 papers
Correlated domain and crystallographic orientation mapping in uniaxial ferroelectric polycrystals by interferometric vector piezoresponse force microscopy
Ruben Dragland, Jan SchultheiÃ, Ivan N. Ushakov +2
Ongoing advances in scanning probe microscopy techniques are continually expanding the possibilities for nanoscale characterization and correlated studies of functional materials.…
Hidden Information in Force Curves: Transient- and Brownian-Driven Dynamics
Roger Proksch, Sergio Santos
Force distance curves (FCs) are direct probes of tip sample interactions in atomic force microscopy, but their dynamic content is often suppressed by filtering, averaging and quasi…
3D Nanoscale Electromechanical Imaging with Interferometric Atomic Force Microscopy
Roger Proksch, Ryan Wagner
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extend…
Lateral force microscopy calibration using an interferometric atomic force microscope
Joel Lefever, Aleksander Labuda, Roger Proksch
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detecto…
Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Towards Fully Automated Microscopy
Yu Liu, Roger Proksch, Jason Bemis +8
Since the dawn of scanning probe microscopy (SPM), tapping or intermittent contact mode has been one of the most widely used imaging modes. Manual optimization of tapping mode not…