most citedSiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis

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cs.CV2026★ 1 cited

SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis

Jing Jie Tan, Rupert Schreiner, Matthias Hausladen +8

Accurate characterization of silicon microstructures is essential for advancing microscale fabrication, quality control, and device performance. Traditional analysis using Scanning…