3 papers
cond-mat.mtrl-sci2026
Resolving Overlapping EBSD Patterns by Experiment -- Simulation Residuals Analysis
Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski +2
In the technique of Electron Backscatter Diffraction (EBSD), the accurate detection and identification of different phases existing in a sample is often limited by overlapping Kiku…
cond-mat.mtrl-sci2025
Simulation-based Super-Resolution EBSD for Measurements of Relative Deformation Gradient Tensors
Aimo Winkelmann, Grzegorz Cios, Konrad PerzyÅski +4
We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation g…
cond-mat.mtrl-sci2025
Pattern Matching Workflows for EBSD Data Analysis: Quartz Chirality Mapping
Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski +1
Pattern matching approaches to electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) provide qualitatively new possibilities for the microstructural ana…