5 papers · 1 filter
A new angle on stacking faults: Overcoming the edge-on limit in high-resolution defect analysis
Nicolas Karpstein, Lukas Müller, Andreas Bezold +3
The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techni…
3D Electron Diffraction -- The Missing Slice for a Complete Nanoscale Analysis of Organic Solar Cells in TEM
Irene Kraus, Mingjian Wu, Stefanie Rechberger +11
Optimizing the performance of organic solar cells (OSCs) hinges on a comprehensive understanding of their nanostructures, yet traditional characterization methods often fall short,…
Correlative and in situ microscopy investigation of phase transformation, crystal growth and degradation of antimony sulfide thin films
Mingjian Wu, Maïssa K. S. Barr, Vanessa M. Koch +8
Antimony sulfide (SbS), a compound of earth-abundant elements with highly anisotropic, quasi-layered crystal structure, triggered growing interest as a solar absorber in ph…
Correlative X-ray and electron tomography for scale-bridging, quantitative analysis of complex, hierarchical particle systems
Alexander Götz, Fabian Lutter, Dennis Simon Possart +18
This study presents a comprehensive workflow for investigating particulate materials through combined 360° electron tomography (ET), nano-computed X-ray tomography (nanoCT), and m…
Identification of Polytypism and Their Dislocations in Bilayer MoS2 Using Correlative Transmission Electron Microscopy and Raman Spectroscopy
Xin Zhou, Tobias Dierke, Mingjian Wu +7
Stacking orders and topological defects substantially influence the physical properties of 2D van der Waals (vdW) materials. However, the inherent features of 2D materials challeng…