collaborators

1 paper

cond-mat.mtrl-sci2026

A new angle on stacking faults: Overcoming the edge-on limit in high-resolution defect analysis

Nicolas Karpstein, Lukas Müller, Andreas Bezold +3

The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techni…