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researcher

Yen‐Fu Lin

1 paper here

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author position
  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cond-mat.mes-hall1
ORCID 0000-0002-1545-9143

identity via Semantic Scholar / OpenAlex

most citedThickness Scaling Effect on Interfacial Barrier and Electrical Contact to Two-Dimensional MoS2 Layers

186 citations · 186 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mes-hall2014★ 186 cited

Thickness Scaling Effect on Interfacial Barrier and Electrical Contact to Two-Dimensional MoS2 Layers

Song-Lin Li, K. Komatsu, Shu Nakaharai +4

Understanding the interfacial electrical properties between metallic electrodes and low dimensional semiconductors is essential for both fundamental science and practical applicati…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.