works on
cantilever dynamics 1electrostatic artifacts 1electrostatic blind spots 1null spots 1piezoresponse force microscopy 1

From the 1 of 9 linked papers with an AI index.

activity
20242026
collaborators
Showing eess.IVShow all

1 paper · 1 filter

eess.IV2025

A Fourier-Based Global Denoising Model for Smart Artifacts Removing of Microscopy Images

Huanhuan Zhao, Connor Vernachio, Laxmi Bhurtel +9

Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and n…