2 papers
cs.CV2026
Atomic Depth Estimation From Noisy Electron Microscopy Data Via Deep Learning
Matan Leibovich, Mai Tan, Ramon Manzorro +4
We present a novel approach for extracting 3D atomic-level information from transmission electron microscopy (TEM) images affected by significant noise. The approach is based on fo…
physics.ins-det2025
Revealing Information from Weak Signal in Electron Energy-Loss Spectroscopy with a Deep Denoiser
Yifan Wang, Mai Tan, Carlos Fernandez-Granda +1
Electron energy-loss spectroscopy (EELS) coupled with scanning transmission electron microscopy (STEM) is a powerful technique to determine materials composition and bonding with h…