collaborators

1 paper

cond-mat.soft2014

Nanomorphology of Annealed P3HS and P3HS:PCBM Films for OPV Applications

Samuele Lilliu, Mejd Alsari, Marcus S. Dahlem +1

Atomic Force Microscopy (AFM) and Grazing Incidence X-Ray Diffraction (GI-XRD) are used to characterize the nanomorphology of spin-coated low (LMW, Mn = 12 kg/mol, regioregularity…