activity
19972024
most citedClassical Analogue of Electromagnetically Induced Transparency with a Metal-Superconductor Hybrid Metamaterial

279 citations · 5.3k across the 143 of their papers we have counts for

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Showing 2002Show all

6 papers · 1 filter

cond-mat.supr-con2002★ 20 cited

Imaging Local Sources of Intermodulation in Superconducting Microwave Devices

A. P. Zhuravel, A. V. Ustinov, D. Abraimov +1

This work presents new experimental results on low-temperature (LT) characterization of local rf properties of passive superconducting (SC) microwave devices using a novel Laser Sc…

cond-mat.supr-con2002★ 13 cited

Study of Local Nonlinear Properties Using a Near-Field Microwave Microscope

Sheng-Chiang Lee, Steven M. Anlage

We have developed a near-field microwave microscope to locally apply microwave frequency currents and fields to superconductors, and dielectric substrates, and measure the locally…

cond-mat.supr-con2002★ 31 cited

Spatially Resolved Nonlinearity Measurements of YBaCuO Bi-crystal Grain Boundaries

Sheng-Chiang Lee, Steven M. Anlage

We have developed a near-field microwave microscope to locally excite a superconducting film and measure second and third harmonic responses at microwave frequencies. We study the…

cond-mat.supr-con2002★ 32 cited

Effect of LaAlO Surface Topography on RF Current Distribution in Superconducting Microwave Devices

A. P. Zhuravel, A. V. Ustinov, H. Harshavardhan +1

A laser scanning microscope with a thermal spot size of about 4 m is used to measure a quantity proportional to the rf current density in an operating superconducting co-planar…

nlin.CD2002

Effects of RF Stimulus and Negative Feedback on Nonlinear Circuits

Renato Mariz de Moraes, Steven M. Anlage

We investigate the combined effect of rectification and nonlinear dynamics on the behavior of several simple nonlinear circuits. We consider the classic Resistor-Inductor-Diode (RL…

cond-mat.mtrl-sci2002

A novel Microwave Frequency Scanning Capacitance Microscope

Atif Imtiaz, Steven M. Anlage

We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm ab…