activity
20242026
most citedIs Chain-of-Thought Reasoning of LLMs a Mirage? A Data Distribution Lens

5 citations · 5 across the 2 of their papers we have counts for

collaborators
Showing cs.CVShow all

1 paper · 1 filter

cs.CV2025

SparseC-AFM: a deep learning method for fast and accurate characterization of MoS with C-AFM

Levi Harris, Md Jayed Hossain, Mufan Qiu +6

The increasing use of two-dimensional (2D) materials in nanoelectronics demands robust metrology techniques for electrical characterization, especially for large-scale production.…