Automating the analysis of micron-scale synchrotron diffraction data on inhomogeneous polycrystalline samples: a solid oxide electrolysis cell case study

Liam A. V. Nagle-Cocco, Christopher A. Crain, Michael J. Dzara +6

A novel approach to post mortem characterisation of electrochemical and photovoltaic devices is spatially-resolved diffraction using a hyper-focused, micron-width x-ray beam to exa…