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researcher

E. Yu. Panchenko

1 paper here

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author position
  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci1
ORCID 0000-0002-2769-6090

identity via Semantic Scholar / OpenAlex

most citedIndium Tin Oxide film characterization using the classical Hall effect

4 citations · 4 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2015★ 4 cited

Indium Tin Oxide film characterization using the classical Hall effect

Laurens Willems van Beveren, Evgeniy Panchenko, Nik Anachi +5

We have used the classical Hall effect to electrically characterize Indium Tin Oxide (ITO) films grown by two different techniques on silica substrates. ITO films have the unique p…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.