7 citations · 18 across the 5 of their papers we have counts for
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physics.data-an2003★ 3 cited
Statistical Yield Modeling for IC Manufacture: Hierarchical Fault Distributions
Yu. I. Bogdanov, N. A. Bogdanova, V. L. Dshkhunyan
A hierarchical approach to the construction of compound distributions for process-induced faults in IC manufacture is proposed. Within this framework, the negative binomial distrib…
physics.data-an2002★ 6 cited
Statistical Inverse Problem
Yu. I. Bogdanov
A fundamental problem of statistical data analysis, distribution density estimation by experimental data, is considered. A new method with optimal asymptotic behavior, the root den…