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device modeling 1dram reliability 1read disturbance 1rowhammer 1tcad simulation 1

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1 paper

cs.AR2026

Demystifying DRAM Read Disturbance: Bridging the Gap Between Experimental Characterization and Device-Level Modeling of RowHammer and RowPress Phenomena

Haocong Luo, Longda Zhou, Ataberk Olgun +5

The paper links experimental observations of DRAM read‑disturbance errors (RowHammer and RowPress) with detailed device‑level models using TCAD simulations, identifying gaps and up…