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cs.IT2024
Deep Transfer Learning-based Detection for Flash Memory Channels
Zhen Mei, Kui Cai, Long Shi +3
The NAND flash memory channel is corrupted by different types of noises, such as the data retention noise and the wear-out noise, which lead to unknown channel offset and make the…
cs.IT2024
Quantization Design for Resistive Memories With Multiple Reads
Zhen Mei, Kui Cai, Long Shi +1
Due to the crossbar array architecture, the sneak-path problem severely degrades the data integrity in the resistive random access memory (ReRAM). In this letter, we investigate th…