activity
20122019
most citedReading and Writing Single-Atom Magnets

436 citations · 688 across the 8 of their papers we have counts for

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Showing cond-mat.mes-hallShow all

6 papers · 1 filter

cond-mat.mes-hall2019★ 89 cited

Tuning the exchange bias on a single atom from 1 mT to 10 T

Kai Yang, William Paul, Fabian D. Natterer +8

Shrinking spintronic devices to the nanoscale ultimately requires localized control of individual atomic magnetic moments. At these length scales, the exchange interaction plays im…

cond-mat.mes-hall2017★ 131 cited

Engineering the eigenstates of coupled spin-1/2 atoms on a surface

Kai Yang, Yujeong Bae, William Paul +8

Quantum spin networks having engineered geometries and interactions are eagerly pursued for quantum simulation and access to emergent quantum phenomena such as spin liquids. Spin-1…

cond-mat.mes-hall2016★ 436 cited

Reading and Writing Single-Atom Magnets

Fabian D. Natterer, Kai Yang, William Paul +5

The highest-density magnetic storage media will code data in single-atom bits. To date, the smallest individually addressable bistable magnetic bits on surfaces consist of 5-12 ato…

cond-mat.mes-hall2015★ 1 cited

Interplay between Orbital Magnetic Moment and Crystal Field Symmetry: Fe atoms on MgO

S. Baumann, F. Donati, S. Stepanow +15

We combine density functional theory, x-ray magnetic circular dichroism, multiplet calculations, and scanning tunneling spectroscopy to assess the magnetic properties of Fe atoms a…

cond-mat.mes-hall2013★ 2 cited

Comment on 'Field ion microscopy characterized tips in noncontact atomic force microscopy: Quantification of long-range force interactions'

William Paul, Peter Grütter

A recent article by Falter et al. (Phys. Rev. B 87, 115412 (2013)) presents experimental results using field ion microscopy characterized tips in noncontact atomic force microscopy…

cond-mat.mes-hall2012★ 15 cited

Implementation of atomically defined Field Ion Microscopy tips in Scanning Probe Microscopy

William Paul, Yoichi Miyahara, Peter Grütter

The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since…