48 citations · 177 across the 18 of their papers we have counts for
3 papers · 1 filter
Co-GISAXS as a New Technique to Investigate Surface Growth Dynamics
Meliha G. Rainville, Christa Hoskin, Jeffrey G. Ulbrandt +5
Detailed quantitative measurement of surface dynamics during thin film growth is a major experimental challenge. Here X-ray Photon Correlation Spectroscopy with coherent hard X-ray…
Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition
Jeffrey G. Ulbrandt, Meliha G. Rainville, Christa Hoskin +5
The properties of artificially grown thin films are often strongly affected by the dynamic relationship between surface growth processes and subsurface structure. Coherent mixing o…
Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle x-ray scattering
Jolien Dendooven, Kilian Devloo-Casier, Matthias Ide +6
Atomic layer deposition (ALD) enables the conformal coating of porous materials, making the technique suitable for pore size tuning at the atomic level, e.g., for applications in c…