48 citations · 60 across the 3 of their papers we have counts for
4 papers · 1 filter
Measurement of Ehrlich-Schwoebel barrier contribution to the self-organized formation of ordered surface patterns on Ge(001)
Peco Myint, Denise Erb, Xiaozhi Zhang +6
Normal incidence 1 keV Ar ion bombardment leads to amorphization and ultrasmoothing of Ge at room temperature, but at elevated temperatures the Ge surface remains crystalline a…
Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint +6
The properties of artificially grown thin films are strongly affected by surface processes during growth. Coherent X-rays provide an approach to better understand such processes an…
Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle x-ray scattering
Jolien Dendooven, Kilian Devloo-Casier, Matthias Ide +6
Atomic layer deposition (ALD) enables the conformal coating of porous materials, making the technique suitable for pore size tuning at the atomic level, e.g., for applications in c…
Supplemental Material for "High Contrast X-ray Speckle from Atomic-Scale Order in Liquids and Glasses"
S. O. Hruszkewycz, M. Sutton, P. H. Fuoss +13
This supplemental material gives additional detail on Experimental Methods and Hard X-ray FEL Source Characteristics, Calculation of Maximum Speckle Contrast, Extracting Contrast o…