activity
20072022
most citedRoadmap of spin-orbit torques

597 citations · 4.3k across the 121 of their papers we have counts for

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Showing 2016Show all

12 papers · 1 filter

cs.ET2016★ 1 cited

MESL: Proposal for a Non-volatile Cascadable Magneto-Electric Spin Logic

Akhilesh Jaiswal, Kaushik Roy

In the quest for novel, scalable and energy-efficient computing technologies, many non-charge based logic devices are being explored. Recent advances in multi-ferroic materials hav…

cs.NE2016★ 85 cited

Proposal for a Leaky-Integrate-Fire Spiking Neuron based on Magneto-Electric Switching of Ferro-magnets

Akhilesh Jaiswal, Sourjya Roy, Gopalakrishnan Srinivasan +1

The efficiency of the human brain in performing classification tasks has attracted considerable research interest in brain-inspired neuromorphic computing. Hardware implementations…

cs.ET2016★ 6 cited

Ising spin model using Spin-Hall Effect (SHE) induced magnetization reversal in Magnetic-Tunnel-Junction

Yong Shim, Akhilesh Jaiswal, Kaushik Roy

Ising spin model is considered as an efficient computing method to solve combinatorial optimization problems based on its natural tendency of convergence towards low energy state.…

cond-mat.mes-hall2016

Buttiker Probe Based Modeling of TDDB: Application to Dielectric Breakdown in MTJs and MOS Devices

Ahmed Kamal Reza, Mohammad Khaled Hassan, Kaushik Roy

Dielectric layers are gradually being down-scaled in different electronic devices like MOSFETs and Magnetic Tunnel Junctions (MTJ) with shrinking device sizes. As a result, time de…

cs.CV2016★ 1 cited

FALCON: Feature Driven Selective Classification for Energy-Efficient Image Recognition

Priyadarshini Panda, Aayush Ankit, Parami Wijesinghe +1

Machine-learning algorithms have shown outstanding image recognition or classification performance for computer vision applications. However, the compute and energy requirement for…

cond-mat.mes-hall2016★ 3 cited

Investigation of Dependence between Time-zero and Time-dependent Variability in High-k NMOS Transistors

Mohammad Khaled Hassan, Kaushik Roy

Bias Temperature Instability (BTI) is a major reliability concern in CMOS technology, especially with High dielectric constant (High-\k{appa}/HK) metal gate (MG) transistors. In ad…