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Direct Imaging of Electron Orbitals with a Scanning Transmission Electron Microscope
Ondrej Dyck, Jawaher Almutlaq, Jacob L. Swett +3
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material's properties such as electrical conductivity, connectivity, a…
Enabling Autonomous Electron Microscopy for Networked Computation and Steering
Anees Al-Najjar, Nageswara S. V. Rao, Ramanan Sankaran +6
Advanced electron microscopy workflows require an ecosystem of microscope instruments and computing systems possibly located at different sites to conduct remotely steered and auto…
A roadmap for edge computing enabled automated multidimensional transmission electron microscopy
Debangshu Mukherjee, Kevin M. Roccapriore, Anees Al-Najjar +8
The advent of modern, high-speed electron detectors has made the collection of multidimensional hyperspectral transmission electron microscopy datasets, such as 4D-STEM, a routine.…
Electron-beam Introduction of Heteroatomic Pt-Si Structures in Graphene
Ondrej Dyck, Cheng Zhang, Philip D. Rack +5
Electron-beam (e-beam) manipulation of single dopant atoms in an aberration-corrected scanning transmission electron microscope is emerging as a method for directed atomic motion a…
Mapping Conductance and Switching Behavior of Graphene Devices In Situ
Ondrej Dyck, Jacob L. Swett, Charalambos Evangeli +3
Graphene has been proposed for use in various nanodevice designs, many of which harness emergent quantum properties for device functionality. However, visualization, measurement, a…
Contrast mechanisms in secondary electron e-beam induced current (SEEBIC) imaging
Ondrej Dyck, Jacob L. Swett, Charalambos Evangeli +3
Over the last few years, a new mode for imaging in the scanning transmission electron microscope (STEM) has gained attention as it permits the direct visualization of sample conduc…